DocumentCode :
317068
Title :
Quick generation of temporal power waveforms for RT-level hard macros
Author :
Benini, L. ; De Micheli, G. ; Macii, E. ; Poncino, M. ; Scarsi, R.
Author_Institution :
Comput. Syst. Lab., Stanford Univ., CA, USA
fYear :
1997
fDate :
8-10 Oct 1997
Firstpage :
331
Lastpage :
337
Abstract :
Power characterization of complex macros is essential to enable accurate RT-level power estimation. Existing characterization procedures focus on the average value of power. In this paper, we take a fresh look at this problem. We propose a fast, yet accurate technique to determine a time-dependent power model, i.e., a temporal power waveform, which is able to fully characterize the power behavior of a hard macro in response to a realistic input stream consisting of typical usage patterns. Our approach is simulation-based, and resorts to a mix of high-level, fast cycle-based simulation with low-level, slow accurate simulation of the long set of input patterns. Results are extremely satisfactory, since the average error between the power waveforms generated by our tool and the exact ones is always within 1%, while the reduction in the execution time ranges between one and two orders of magnitude
Keywords :
circuit analysis computing; high level synthesis; macros; RT-level hard macros; RT-level power estimation; complex macros; fast generation; high-level cycle-based simulation; low-level accurate simulation; power characterization; simulation-based method; temporal power waveforms; time-dependent power model; two level simulation; Character generation; Circuit simulation; Computational modeling; Energy consumption; Hardware design languages; Laboratories; Libraries; Microelectronics; Power generation; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Innovative Systems in Silicon, 1997. Proceedings., Second Annual IEEE International Conference on
Conference_Location :
Austin, TX
ISSN :
1094-7116
Print_ISBN :
0-7803-4276-3
Type :
conf
DOI :
10.1109/ICISS.1997.630276
Filename :
630276
Link To Document :
بازگشت