DocumentCode :
3170691
Title :
Signal processing methods for time domain EMI measurements
Author :
Krug, Florian ; Russer, Peter
Author_Institution :
Lehrstuhl fur Hochfrequenztech., Technische Univ. Munchen, Munich, Germany
Volume :
2
fYear :
2003
fDate :
11-16 May 2003
Firstpage :
1289
Abstract :
In this paper, we discuss the advantages of broadband time-domain measurement techniques applied to electromagnetic interference (EMI) problems. The digital signal processing of EMI measurements allows to emulate in real-time the various modes of conventional analogous equipment, e.g., peak-, average-, RMS- and quasi-peak-detector mode. It is also possible to introduce new concepts of analysis, e.g., phase spectra, short-time spectra, statistical evaluation and FFT-based time-frequency analysis methods. Since time-domain techniques allow to process the amplitude and phase information of the whole signal spectrum in parallel, the measurement time may be reduced by at least one order of magnitude. The signal processing algorithms and the measurement results obtained with the time-domain electromagnetic interference (TDEMI) measurement system are discussed.
Keywords :
data acquisition; electromagnetic interference; fast Fourier transforms; real-time systems; signal processing; spectral analysis; superheterodyne receivers; time-frequency analysis; FFT based time-frequency analysis methods; RMS detector mode; average detector mode; broadband time domain EMI measurements; digital signal processing methods; phase spectra; quasipeak detector mode; short time spectra; signal processing algorithms; statistical evaluation; time domain electromagnetic interference measurement system; Digital signal processing; Electromagnetic interference; Electromagnetic measurements; Measurement techniques; Phase measurement; Signal processing; Signal processing algorithms; Time domain analysis; Time frequency analysis; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2003. EMC '03. 2003 IEEE International Symposium on
Print_ISBN :
0-7803-7779-6
Type :
conf
DOI :
10.1109/ICSMC2.2003.1429156
Filename :
1429156
Link To Document :
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