• DocumentCode
    3171278
  • Title

    Robust ADC concept for integrated CMOS systems

  • Author

    Eklund, Jan-Erik

  • Author_Institution
    Ericsson Components AB, Stockholm, Sweden
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    126
  • Lastpage
    129
  • Abstract
    The ADC is found to be very robust against electrical noise in the substrate and from the output pads. Whether the square wave signal test is representative or not, the PSA-ADC can stand high (>1 V) disturbing signals in the substrate and is therefore suitable for systems integration. The noise and linearity measurements clearly shows that a PSA-ADC with 12-bit resolution is feasible. This ADC can easily be adapted to various applications with different requirements. Only the comparators are analog and need some care. The number of cells and subranging stages can be adjusted to meet a specific requirement in terms of speed and resolution. This together with the noise immunity and the scalability makes this ADC suitable for systems integration
  • Keywords
    CMOS integrated circuits; ADC; electrical noise; integrated CMOS systems; linearity measurements; resolution; scalability; speed; square wave signal test; subranging stages; systems integration;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Advanced A/D and D/A Conversion Techniques and Their Applications, 1999. Third International Conference on (Conf. Publ. No. 466)
  • Conference_Location
    Glasgow
  • ISSN
    0537-9989
  • Print_ISBN
    0-85296-718-7
  • Type

    conf

  • DOI
    10.1049/cp:19990480
  • Filename
    794003