DocumentCode
3171278
Title
Robust ADC concept for integrated CMOS systems
Author
Eklund, Jan-Erik
Author_Institution
Ericsson Components AB, Stockholm, Sweden
fYear
1999
fDate
1999
Firstpage
126
Lastpage
129
Abstract
The ADC is found to be very robust against electrical noise in the substrate and from the output pads. Whether the square wave signal test is representative or not, the PSA-ADC can stand high (>1 V) disturbing signals in the substrate and is therefore suitable for systems integration. The noise and linearity measurements clearly shows that a PSA-ADC with 12-bit resolution is feasible. This ADC can easily be adapted to various applications with different requirements. Only the comparators are analog and need some care. The number of cells and subranging stages can be adjusted to meet a specific requirement in terms of speed and resolution. This together with the noise immunity and the scalability makes this ADC suitable for systems integration
Keywords
CMOS integrated circuits; ADC; electrical noise; integrated CMOS systems; linearity measurements; resolution; scalability; speed; square wave signal test; subranging stages; systems integration;
fLanguage
English
Publisher
iet
Conference_Titel
Advanced A/D and D/A Conversion Techniques and Their Applications, 1999. Third International Conference on (Conf. Publ. No. 466)
Conference_Location
Glasgow
ISSN
0537-9989
Print_ISBN
0-85296-718-7
Type
conf
DOI
10.1049/cp:19990480
Filename
794003
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