Title :
Propagating variability from technology to system level
Author :
Dierickx, Bart ; Miranda, Miguel ; Dobrovolny, Petr ; Kutscherauer, Florian ; Papanikolaou, Antonis ; Marchal, Pol
Author_Institution :
IMEC, Leuven
Abstract :
As CMOS technology feature sizes decrease, variability more and more jeopardizes system level parametric and functional yield. This paper proposes a framework that can capture variability at all levels in the design flow. It offers a correlated view on yield, timing, dynamic and static energy. Preservation on rare events in variability distributions is obtained by the Weighted Monte Carlo technique.
Keywords :
CMOS integrated circuits; Monte Carlo methods; CMOS technology; functional yield; system level; variability; weighted Monte Carlo technique; CMOS technology; Circuits; Design for manufacture; Frequency estimation; Monte Carlo methods; Optical distortion; Shape; Timing; Virtual manufacturing; Yield estimation; Weighted Monte Carlo; system level; technology aware design; variability; variability aware modeling; yield estimation;
Conference_Titel :
Physics of Semiconductor Devices, 2007. IWPSD 2007. International Workshop on
Conference_Location :
Mumbai
Print_ISBN :
978-1-4244-1728-5
Electronic_ISBN :
978-1-4244-1728-5
DOI :
10.1109/IWPSD.2007.4472457
