DocumentCode :
3171582
Title :
Experimental analysis of the effect of substrate noise on PLL performance
Author :
Jenkins, Keith A. ; Rhee, Woogeun ; Liobe, John ; Ainspan, Herschel
Author_Institution :
T.J. Watson Res. Center, IBM, Yorktown Heights, NY
fYear :
2006
fDate :
18-20 Jan. 2006
Abstract :
A novel approach is used to identify the substrate-noise sensitive components of a phase-locked loop (PLL) using a tank (LC) voltage controlled oscillator (VCO). Using passive noise injection pads capacitively connected to the substrate, continuous wave (CW) noise is injected into the substrate. The frequency response of the PLL is measured as noise is injected near dc, near the reference clock frequency, and near the VCO frequency. Analyzing the spurs seen in a spectrum analyzer leads to the conclusion that the other PLL blocks can be more sensitive to substrate noise coupling than the VCO, depending on the substrate noise frequency
Keywords :
frequency response; integrated circuit noise; phase locked loops; phase noise; spectral analysers; voltage-controlled oscillators; VCO frequency; continuous wave noise; frequency response; passive noise injection pads; phase-locked loop; reference clock frequency; spectrum analyzer; substrate noise coupling; substrate noise effect; substrate noise frequency; voltage controlled oscillator; Circuit noise; Coupling circuits; Frequency; Low-frequency noise; Noise generators; Noise measurement; Performance analysis; Phase locked loops; Phase noise; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Silicon Monolithic Integrated Circuits in RF Systems, 2006. Digest of Papers. 2006 Topical Meeting on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-9472-0
Type :
conf
DOI :
10.1109/SMIC.2005.1587903
Filename :
1587903
Link To Document :
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