DocumentCode :
3171630
Title :
Microstructural and optical properties of potassium niobate thin films
Author :
Chow, Alice F. ; Lichrenwalner, D.J. ; Graettinger, Thomas M. ; Busch, James R. ; Auciello, Orlando ; Kingon, Angus I.
Author_Institution :
Dept. of Mater. Sci. & Eng., North Carolina State Univ., Raleigh, NC, USA
fYear :
1991
fDate :
33457
Firstpage :
794
Lastpage :
796
Abstract :
A potassium niobate thin film waveguide is an ideal candidate for producing a compact blue laser source by second harmonic generation. However, good epitaxial quality films are difficult to produce and high optical losses are a continuing problem. A report is presented in this paper on the investigations of the microstructural and optical properties of KNbO3 thin films to better understand the origin of optical waveguide losses. Epitaxial, dense KNbO3 thin films have been grown on MgO, MgAl2O4, and KTaO3 substrates by ion-beam sputter deposition. X-ray diffraction, rocking curves, Rutherford backscattering spectroscopy, ion-channelling, field emission scanning electron microscopy, and atomic force microscopy were used to analyze the orientation, epitaxial quality, grain size, and surface roughness of the films. Optical properties including refractive index and optical scattering losses have been characterized by prism-coupling and an optical fiber loss measurement method. The dominant loss mechanism in these film waveguides is discussed. Green light by second harmonic generation has been produced in the transverse and waveguide modes in KNbO3 films
Keywords :
Rutherford backscattering; X-ray diffraction; atomic force microscopy; channelling; crystal microstructure; crystal orientation; epitaxial growth; epitaxial layers; ferroelectric materials; ferroelectric thin films; field emission electron microscopy; grain size; optical harmonic generation; optical losses; optical planar waveguides; potassium compounds; refractive index; scanning electron microscopy; sputtered coatings; surface topography; waveguide lasers; KNbO3; KTaO3; MgAl2O4; MgO; Rutherford backscattering spectroscopy; X-ray diffraction; atomic force microscopy; compact blue laser source; epitaxial quality; field emission scanning electron microscopy; good epitaxial quality films; grain size; green light; high optical losses; ion-beam sputter deposition; ion-channelling; microstructural properties; optical fiber loss measurement method; optical properties; optical scattering losses; orientation; prism-coupling; refractive index; rocking curves; second harmonic generation; surface roughness; thin film waveguide; transverse modes; waveguide modes; Niobium compounds; Nonlinear optics; Optical films; Optical harmonic generation; Optical losses; Optical refraction; Optical scattering; Optical variables control; Optical waveguides; Sputtering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Ferroelectrics, 1994.ISAF '94., Proceedings of the Ninth IEEE International Symposium on
Conference_Location :
University Park, PA
Print_ISBN :
0-7803-1847-1
Type :
conf
DOI :
10.1109/ISAF.1994.522493
Filename :
522493
Link To Document :
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