DocumentCode :
317179
Title :
1.3-μm spot-size converter integrated laser diodes (SS-LDs) for access network applications
Author :
Tohmori, Yuichi ; Itaya, Yoshio ; Toba, Hiromu
Author_Institution :
NTT Opto-Electron. Labs., Kanagawa, Japan
Volume :
1
fYear :
1997
fDate :
10-13 Nov 1997
Firstpage :
270
Abstract :
We have developed spot-size converter integrated laser diodes (SS-LDs) that include a mechanism for matching the optical field with the fiber and the planar lightwave circuit (PLC). We report the achievement of: reproducible lasing characteristics from 2-inch wafers; stable characteristics up to high temperature; and long-term stability at 85°C. The taper-layer in the SS region is butt-jointed to the active layer. The merit of the butt-joint structure is that it allows the independent structural optimization of the active and SS regions. The active layer consists of compressive strained multi-quantum-well (MQW) structure with 8 wells to increase the maximum operation temperature effectively. The strain is 1.2% in InGaAsP wells, which are 6-nm thick. The taper layer consists of a 1.1-μm-bandgap bulk layer. The taper-layer thickness changes exponentially from the butt-joint portion to the front facet, which effectively reduces radiation loss in the SS region
Keywords :
III-V semiconductors; gallium arsenide; indium compounds; laser reliability; laser stability; laser transitions; optical fibre subscriber loops; optical planar waveguides; quantum well lasers; 1.3 mum; 2 in; 2-inch wafers; 6 nm; 85 degC; InGaAsP; InGaAsP wells; access network applications; active layer; butt-joint; compressive strained MQW structure; fiber; front facet; high temperature; long-term stability; optical field; planar lightwave circuit; radiation loss; reproducible lasing characteristics; spot-size converter integrated laser diodes; stable characteristics; structural optimization; taper layer; taper-layer; Diode lasers; Electrons; Optical coupling; Optical fiber networks; Optical fibers; Programmable control; Pulse measurements; Temperature; Threshold current; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1997. LEOS '97 10th Annual Meeting. Conference Proceedings., IEEE
Conference_Location :
San Francisco, CA
ISSN :
1092-8081
Print_ISBN :
0-7803-3895-2
Type :
conf
DOI :
10.1109/LEOS.1997.630620
Filename :
630620
Link To Document :
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