DocumentCode :
3172051
Title :
Experiences in Hardware Trojan design and implementation
Author :
Jin, Yier ; Kupp, Nathan ; Makris, Yiorgos
Author_Institution :
Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA
fYear :
2009
fDate :
27-27 July 2009
Firstpage :
50
Lastpage :
57
Abstract :
We report our experiences in designing and implementing several hardware Trojans within the framework of the Embedded System Challenge competition that was held as part of the Cyber Security Awareness Week (CSAW) at the Polytechnic Institute of New York University in October 2008. Due to the globalization of the Integrated Circuit (IC) manufacturing industry, hardware Trojans constitute an increasingly probable threat to both commercial and military applications. With traditional testing methods falling short in the quest of finding hardware Trojans, several specialized detection methods have surfaced. To facilitate research in this area, a better understanding of what Hardware Trojans would look like and what impact they would incur to an IC is required. To this end, we present eight distinct attack techniques employing Register Transfer Level (RTL) hardware Trojans to compromise the security of an Alpha encryption module implemented on a Digilent BASYS Spartan-3 FPGA board. Our work, which earned second place in the aforementioned competition, demonstrates that current RTL designs are, indeed, quite vulnerable to hardware Trojan attacks.
Keywords :
security of data; Alpha encryption module; embedded system challenge competition; hardware Trojan attack; hardware Trojan design; register transfer level; Application specific integrated circuits; Circuit testing; Computer science; Computer security; Cryptography; Embedded system; Field programmable gate arrays; Foundries; Hardware design languages; Manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Hardware-Oriented Security and Trust, 2009. HOST '09. IEEE International Workshop on
Conference_Location :
Francisco, CA
Print_ISBN :
978-1-4244-4805-0
Electronic_ISBN :
978-1-4244-4804-3
Type :
conf
DOI :
10.1109/HST.2009.5224971
Filename :
5224971
Link To Document :
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