DocumentCode :
317223
Title :
Asymmetric diamines as thermally stable hole transporters in organic light emitting devices, synthesis and characterization
Author :
Loy, Doug E. ; Koene, Bryan E. ; Thompson, Mark E.
Author_Institution :
Univ. of Southern California, Los Angeles, CA, USA
Volume :
1
fYear :
1997
fDate :
10-13 Nov 1997
Firstpage :
364
Abstract :
One of the major causes of device degradation in organic thin film devices is the thermal instability of the hole transporting layer. In vacuum deposited organic light emitting devices (OLEDs) this layer usually consists of a biphenyl diamine such as TPD, which is a biphenyl that has a phenyl tolyl amine moiety at both ends. TPD has a glass transition temperature (Tg) of about 60 C. Devices made with TPD show catastrophic failure when the device is heated to near the Tg. In our efforts to design thermally stable hole transporters, as well as to understand how chemical structure relates to Tg, we have synthesized a variety of asymmetric biphenyl amines. These amines consist of a triaryl amine attached at one end of a biphenyl along with a different triaryl amine at the other end of the biphenyl
Keywords :
glass transition; hole mobility; luminescent devices; optical fabrication; optical films; optical materials; organic compounds; reliability; thin film devices; TPD; asymmetric biphenyl amines; asymmetric diamines; biphenyl; biphenyl diamine; catastrophic failure; chemical structure; device degradation; glass transition temperature; hole transporting layer; organic light emitting device synthesis; organic thin film devices; phenyl tolyl amine moiety; thermal instability; thermally stable hole transporter design; thermally stable hole transporters; triaryl amine; vacuum deposited organic light emitting devices; Amorphous materials; Chemicals; Crystallization; Glass; Impurities; Organic light emitting diodes; Temperature; Thermal degradation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1997. LEOS '97 10th Annual Meeting. Conference Proceedings., IEEE
Conference_Location :
San Francisco, CA
ISSN :
1092-8081
Print_ISBN :
0-7803-3895-2
Type :
conf
DOI :
10.1109/LEOS.1997.630669
Filename :
630669
Link To Document :
بازگشت