Title :
A family of buck-type DC-DC converters with autotransformers
Author :
Yao, Kaiwei ; Ren, Yuancheng ; Wei, Jia ; Xu, Ming ; Lee, Fred C.
Author_Institution :
Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Abstract :
This paper introduces a family of buck-type DC-DC converters with autotransformers, including forward, push-pull, half-bridge, and full-bridge topologies. Compared with an isolated transformer, the autotransformer has a simpler winding structure, and it only needs to transfer part of the input power, resulting in a smaller secondary winding current. Analysis shows that the autotransformer can also help to reduce the voltage stress and current ratings of power devices in the DC-DC converters. For some applications, a simple lossless passive clamp circuit can be implemented to solve the transformer leakage problems, and the gate drive is significantly improved with a simple self-adaptive dead-time-controlled bootstrap gate driver. Simulation and experimental results show that the proposed topologies are very suitable for high-frequency applications.
Keywords :
DC-DC power convertors; adaptive control; autotransformers; bridge circuits; driver circuits; transformer windings; voltage control; voltage regulators; 12 to 1.5 V; 25 A; 30 A; 300 kHz; 5 to 2 V; autotransformers; buck-type DC-DC converters; forward DC-DC converter topology; full-bridge DC-DC converter topology; gate drive; half-bridge DC-DC converter topology; isolated transformer; lossless passive clamp circuit; push-pull DC-DC converter topology; secondary winding current; self-adaptive dead-time-controlled bootstrap gate driver; transformer leakage; voltage regulator module; voltage stress reduction; winding structure; Circuit simulation; Circuit topology; Clamps; DC-DC power converters; Driver circuits; Galvanizing; Power electronics; Pulse width modulation; Pulse width modulation converters; Stress;
Conference_Titel :
Applied Power Electronics Conference and Exposition, 2003. APEC '03. Eighteenth Annual IEEE
Conference_Location :
Miami Beach, FL, USA
Print_ISBN :
0-7803-7768-0
DOI :
10.1109/APEC.2003.1179201