DocumentCode :
317239
Title :
Measurement of output phase relationships of multimode interference splitters using a shearing-type near-field Sagnac interferometer
Author :
Kareenahalli, S. ; Saini, S. ; Dagenais, M. ; Tayag, T.J. ; Euliss, G. ; Stone, D.
Author_Institution :
Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
Volume :
1
fYear :
1997
fDate :
10-13 Nov 1997
Firstpage :
401
Abstract :
Multimode interference (MMI) devices, based on the self-imaging effect, exhibit low excess loss, ultra-compact size, wavelength and polarization insensitivity. These desirable characteristics make MMI splitters/combiners very attractive for wavelength division multiplexing (WDM) applications. A complete study of the phase behavior of MMI devices has to be undertaken to investigate the use of these devices in optical interference based WDM applications. A comprehensive theoretical analysis of phase relations for a general N×N MMI coupler has been reported by M. Bachmann et al.{ see, Appl. Opt., vol. 33, p. 3905, 1994}. Here, we report the experimental measurement of the output phase relationships of AlGaAs-GaAs MMI waveguide splitters, using a ring interferometer
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; integrated optics; light interferometry; optical communication equipment; optical testing; optical waveguides; semiconductor device testing; wavelength division multiplexing; AlGaAs-GaAs; AlGaAs-GaAs MMI waveguide splitters; MMI coupler; MMI splitters/combiners; WDM; light interferometry; low excess loss; multimode interference splitters; optical interference based WDM applications; output phase relationships; phase behavior; phase relations; polarization insensitivity; ring interferometer; self-imaging effect; shearing-type near-field Sagnac interferometer; ultra-compact size; wavelength division multiplexing; wavelength insensitivity; Interference; Optical devices; Optical interferometry; Optical losses; Optical polarization; Optical waveguides; Optimized production technology; Phase measurement; Wavelength division multiplexing; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1997. LEOS '97 10th Annual Meeting. Conference Proceedings., IEEE
Conference_Location :
San Francisco, CA
ISSN :
1092-8081
Print_ISBN :
0-7803-3895-2
Type :
conf
DOI :
10.1109/LEOS.1997.630690
Filename :
630690
Link To Document :
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