ADC testing using joint time-frequency analysis

Presents the joint time-frequency analysis (JTFA) and describes the short time-frequency transform algorithm, in particular as an alternative technique for dynamic testing of ADCs. It was shown that this technique can lead to a significant improvement in ADC testing mainly due the possibility of using nonstationary signals allowing a more rapid test capable of analyzing even localized features like transfer function nonlinearities. Future work will be done concerning the direct extraction of testing parameters from the spectrogram data and the use of more elaborated JTFA algorithms namely the Wigner-Ville distribution