DocumentCode :
3172721
Title :
Formation of Ge-based nanowires for nanoelectronic applications by vapor-liquid-solid mechanism
Author :
Das, K. ; Mondal, S.P. ; Dhar, A. ; Ray, S.K.
Author_Institution :
Indian Inst. of Technol. Kharagpur, Kharagpur
fYear :
2007
fDate :
16-20 Dec. 2007
Firstpage :
377
Lastpage :
379
Abstract :
Using vapour-liquid-solid mechanism, we have grown Ge and composition modulated Ge:SnO2 nanowires on gold coated silicon substrates with diameter distribution ranging from 30-100 nm, and length more than tens of micrometers. The outer sheath of pure Ge nanowires consists of GeO2 as revealed from the XRD and TEM analyses. Raman spectra of the as-grown nanowires exhibit a blue shift, which is attributed to the compressive strain in the wires. The formed T-junction Ge:SnO2 axial nanowire heterostructure is attractive for novel optical and electronic devices.
Keywords :
Raman spectra; X-ray diffraction; compressive strength; germanium; gold; nanoelectronics; nanowires; silicon; tin compounds; transmission electron microscopy; Raman spectra; SnO2:Ge; T-junction; TEM analysis; XRD; axial nanowire heterostructure; blue shift; compressive strain; germanium-based nanowires; gold coated silicon substrates; nanoelectronic applications; size 30 nm to 100 nm; vapor-liquid-solid mechanism; Capacitive sensors; Gold; Nanoparticles; Nanowires; Optical devices; Optical diffraction; Substrates; Temperature; X-ray diffraction; X-ray scattering; Ge-SnO2 nanowire; vapor-liquid-solid;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Physics of Semiconductor Devices, 2007. IWPSD 2007. International Workshop on
Conference_Location :
Mumbai
Print_ISBN :
978-1-4244-1728-5
Electronic_ISBN :
978-1-4244-1728-5
Type :
conf
DOI :
10.1109/IWPSD.2007.4472524
Filename :
4472524
Link To Document :
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