Title :
Improved direct back EMF detection for sensorless brushless DC (BLDC) motor drives
Author :
Shao, Jianwen ; Nolan, Dennis ; Hopkins, Thomas
Author_Institution :
Power Syst. Applications Lab, STMicroelectronics, Schaumburg, IL, USA
Abstract :
Improved back EMF detection circuits for low voltage/low speed and high voltage sensorless BLDC motor drives are presented in this paper. The improvements are based on the direct back EMF sensing method from our previous research work described in reference, which describes a technique for directly extracting phase back EMF information without the need to sense or re-construct the motor neutral. The reference method is not sensitive to switching noise and requires no filtering, achieving much better performance than traditional back EMF sensing scheme. A complementary PWM (synchronous rectification) is proposed to reduce the power dissipation in power devices for low voltage applications. In order to further extend the sensorless BLDC system to lower speed, a pre-conditioning circuit is proposed to amplify the back EMFs at very low speed. As a result, the brushless DC motor can run at lower speed with the improved back EMF sensing scheme. On the other hand, another improved detection circuit is presented for high voltage applications to overcome the delaying problem caused by large sensing resistors. The detailed circuit models are analyzed and experimental results verify the analysis.
Keywords :
DC motor drives; brushless DC motors; electric variables measurement; rectification; 300 V; PWM; circuit models; direct back EMF detection circuits; power dissipation reduction; pre-conditioning circuit; sensing resistors; sensorless BLDC motor drives; sensorless brushless DC motor drives; synchronous rectification; Brushless DC motors; Circuit noise; DC motors; Data mining; Filtering; Low voltage; Motor drives; Power dissipation; Pulse width modulation; Synchronous motors;
Conference_Titel :
Applied Power Electronics Conference and Exposition, 2003. APEC '03. Eighteenth Annual IEEE
Conference_Location :
Miami Beach, FL, USA
Print_ISBN :
0-7803-7768-0
DOI :
10.1109/APEC.2003.1179230