DocumentCode
3172931
Title
Superior performances from fabricated microstructures on MBE-grown IV-VI lead salt materials for mid-infrared applications
Author
Mukherjee, Shaibal ; Jain, S. ; Kar, J.P. ; Shi, Z.
Author_Institution
Univ. of Oklahoma, Norman
fYear
2007
fDate
16-20 Dec. 2007
Firstpage
413
Lastpage
416
Abstract
A detailed study on microstructures in the form of pillars, rods and tubes based on IV-VI lead salt semiconductor structures grown in molecular beam epitaxy (MBE) was described. Several essential fabrication parameters that controlled the morphological aspects of those microstructures were clearly visualized. Tremendous enhancement of pulsed photoluminescence (PL) intensity was achieved from a single microrod or microtube compared to their bulk samples. The micropillar sample, having free-standing pillar diameter of 5 mum with an inter-pillar distance of 8 mum, showed a consistent temperature tunability of ~3.64 cm-1/0K of the pulsed PL emission peaks. All those novel results dictated a promising future of lead-salt based mid-infrared opto-electronics implemented mainly in the field of industrial trace gas-sensing.
Keywords
IV-VI semiconductors; molecular beam epitaxial growth; optoelectronic devices; IV-VI lead salt semiconductor structures; MBE-grown IV-VI lead salt materials; fabricated microstructures; industrial trace gas-sensing; lead-salt based mid-infrared opto-electronics; micropillar sample; mid-infrared applications; molecular beam epitaxy; morphological aspects; pulsed photoluminescence intensity; temperature tunability; Fabrication; Gas industry; Lead compounds; Microstructure; Molecular beam epitaxial growth; Photoluminescence; Semiconductor materials; Structural rods; Temperature; Visualization; Electron Microscope (SEM); MBE; Microstructures; PL; Scanning;
fLanguage
English
Publisher
ieee
Conference_Titel
Physics of Semiconductor Devices, 2007. IWPSD 2007. International Workshop on
Conference_Location
Mumbai
Print_ISBN
978-1-4244-1728-5
Electronic_ISBN
978-1-4244-1728-5
Type
conf
DOI
10.1109/IWPSD.2007.4472536
Filename
4472536
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