Title :
Statistical characterization and Monte-Carlo simulation of low-frequency noise variations in foundry AMS/RF CMOS technology
Author :
Yang, M.T. ; Kuo, C.W. ; Chang, Allen K L ; Wang, Y.J. ; Liu, Sally
Author_Institution :
TSMC, Hsin-Chu
Abstract :
Statistical characterization of low-frequency noise enables the prediction of 1/f noise with dispersions. The impact of downscaling on the low-frequency noise performance of foundry AMS/RF CMOS technology is thus evaluated. Meanwhile, a novel modeling approach uses Monte-Carlo simulation is developed which includes statistical variations of individual device to capture the fluctuations in frequency and amplitude of the low-frequency noise of deep-sub-micrometer CMOS
Keywords :
1/f noise; CMOS integrated circuits; Monte Carlo methods; flicker noise; integrated circuit modelling; integrated circuit noise; radiofrequency integrated circuits; 1/f noise; AMS/RF CMOS technology; Monte-Carlo simulation; flicker noise; low-frequency noise variation; 1f noise; CMOS process; CMOS technology; Circuit noise; Fluctuations; Foundries; Low-frequency noise; Noise reduction; Radio frequency; Semiconductor device modeling;
Conference_Titel :
Silicon Monolithic Integrated Circuits in RF Systems, 2006. Digest of Papers. 2006 Topical Meeting on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-9472-0
DOI :
10.1109/SMIC.2005.1587980
