DocumentCode :
3173047
Title :
Influence of physical parameters and piezoelectric polarization on charge control characteristics of Si3N4/AlGaN/GaN M̲etal I̲nsulator S̲emiconductor H̲eterostructure F̲ield E̲ffect T̲
Author :
Aggarwal, Richie ; Agrawal, Ankit ; Gupta, Madhu ; Gupta, R.S.
Author_Institution :
Univ. of Delhi, Delhi
fYear :
2007
fDate :
16-20 Dec. 2007
Firstpage :
435
Lastpage :
438
Abstract :
An accurate non linear charge-control model of the two dimensional electron gas (2-DEG) of an insulated gate AlGaN/GaN HFET is proposed which incorporates the dominant effect of polarization induced charge at the AlGaN/GaN interface. It is based on new polynomial dependence of sheet carrier density on position of quasi Fermi level to consider the quantum effects and to validate it from sub threshold region to high conduction region. The model gives an accurate description of the device operation for a wide range of physical parameters. The results obtained agree well with the published data.
Keywords :
Fermi level; III-V semiconductors; MISFET; aluminium compounds; carrier density; electric charge; electric potential; gallium compounds; high electron mobility transistors; piezoelectricity; semiconductor device models; silicon compounds; two-dimensional electron gas; wide band gap semiconductors; MISHFET; Si3N4-AlGaN-GaN; charge control characteristics; gate voltage swing; high conduction region; insulated gate HFET; metal insulator semiconductor heterostructure field effect transistor; nonlinear charge-control model; piezoelectric polarization; polarization induced charge; quantum effects; quasiFermi level; sheet carrier density; sub threshold region; two dimensional electron gas; Aluminum gallium nitride; Charge carrier density; Electrons; Gallium nitride; Gas insulation; HEMTs; MODFETs; Optical polarization; Piezoelectric polarization; Polynomials; AlGaN/GaN MISHFET; gate voltage swing; polarization; sheet carrier density; threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Physics of Semiconductor Devices, 2007. IWPSD 2007. International Workshop on
Conference_Location :
Mumbai
Print_ISBN :
978-1-4244-1728-5
Electronic_ISBN :
978-1-4244-1728-5
Type :
conf
DOI :
10.1109/IWPSD.2007.4472542
Filename :
4472542
Link To Document :
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