Title :
Study on magneto-transport in thin HgCdTe crystals
Author :
Manchanda, Rachna ; Sharma, R.K. ; Thakur, O.P. ; Pal, R. ; Raina, A. ; Venkatraman, R. ; Basu, P.K.
Author_Institution :
Solid State Phys. Lab., Delhi
Abstract :
Variable magnetic field Hall and magneto- resistance measurements were carried out at 77K on thin HgCdTe samples of different thickness. A simultaneous multi-carrier fitting of magneto resistance and Hall coefficient vs. magnetic field data was used to extract the bulk and surface carrier information. Studies have been conducted on both chemo-mechanically polished bare samples as well as the ones passivated with anodic oxide. The bulk carrier concentration in very thin (< 30 mum) samples have been found to vary with thickness.
Keywords :
Hall effect; II-VI semiconductors; cadmium compounds; carrier density; magnetoresistance; mercury compounds; Hall coefficient; HgCdTe; bulk carrier; chemo-mechanically polishing; magnetic field Hall; magneto-resistance measurements; magneto-transport; multi-carrier fitting; surface carrier; temperature 77 K; Crystals; Data mining; Electric resistance; Etching; Magnetic field measurement; Magnetic properties; Magnetoresistance; Solid state circuits; Surface fitting; Surface treatment; Hall Coefficient; HgCdTe; Magnetoresistance;
Conference_Titel :
Physics of Semiconductor Devices, 2007. IWPSD 2007. International Workshop on
Conference_Location :
Mumbai
Print_ISBN :
978-1-4244-1728-5
Electronic_ISBN :
978-1-4244-1728-5
DOI :
10.1109/IWPSD.2007.4472549
