Title :
An improved gate control scheme for snubberless operation of high power IGBTs
Author :
Lee, Hwang Geol ; Lee, Yo-Han ; Suh, Bum-Seok ; Hyun, Dong-seok
Author_Institution :
Dept. of Electr. Eng., Hanyang Univ., Seoul, South Korea
Abstract :
This paper proposes a new gate drive circuit for IGBTs which can actively suppress the voltage overshoot across the driven IGBT at turn-off and the voltage overshoot across the opposite IGBT at turn-on while preserving the most simple and reliable power circuit. The turn-off driving scheme has an adaptive feature to the amplitude of collector current, so that the overvoltage is limited much more effectively at the fault collector current. The turn-on scheme is used to decrease the rise rate of the collector current by increasing input capacitance during turn-on transients when the gate-emitter voltage is greater than the threshold voltage. Experimental results under various normal and fault conditions prove the effectiveness of the proposed circuit
Keywords :
bipolar transistor switches; driver circuits; insulated gate bipolar transistors; power bipolar transistors; power semiconductor switches; power system transients; semiconductor device testing; experimental results; fault collector current; gate control scheme; gate drive circuit; gate-emitter voltage; input capacitance; power IGBT switches; snubberless operation; switching transients; threshold voltage; turn-off; turn-on; voltage overshoot suppression; Bipolar transistors; Circuit faults; Diodes; Electrical equipment industry; Inductance; Insulated gate bipolar transistors; Pulse width modulation inverters; Switching circuits; Threshold voltage; Voltage control;
Conference_Titel :
Industry Applications Conference, 1997. Thirty-Second IAS Annual Meeting, IAS '97., Conference Record of the 1997 IEEE
Conference_Location :
New Orleans, LA
Print_ISBN :
0-7803-4067-1
DOI :
10.1109/IAS.1997.628979