DocumentCode :
3173493
Title :
Analytic outlier removal in line fitting
Author :
Netanyahu, Nathan S. ; Weiss, Isaac
Author_Institution :
Div. of Space Data & Comput., NASA Goddard Space Flight Center, Greenbelt, MD, USA
Volume :
2
fYear :
1994
fDate :
9-13 Oct 1994
Firstpage :
406
Abstract :
The conventional ordinary least squares (OLS) method of fitting a line to a set of data points is very unreliable when the amount of random noise in the input (such as an image) is significant compared with the amount of data that is correlated with the lane itself. In this paper we present an analytic method of separating the data of interest from the outliers. We assume that the overall data (i.e., the line data plus the noise) can be modeled as a mixture of two statistical distributions. Applying a variant of the method of moments (MoM) to the assumed model yields an analytic estimate of the desired line
Keywords :
curve fitting; analytic outlier removal; data separation; line fitting; method of moments; mixture models; noise removal; statistical distributions; Automation; Educational institutions; Image processing; Least squares methods; Message-oriented middleware; Moment methods; NASA; Noise generators; Parameter estimation; Pattern recognition;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 1994. Vol. 2 - Conference B: Computer Vision & Image Processing., Proceedings of the 12th IAPR International. Conference on
Conference_Location :
Jerusalem
Print_ISBN :
0-8186-6270-0
Type :
conf
DOI :
10.1109/ICPR.1994.576962
Filename :
576962
Link To Document :
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