• DocumentCode
    3173904
  • Title

    Ultra low power, harsh environment SOI-CMOS design of temperature sensor based threshold detection and wake-up IC

  • Author

    Assaad, M. ; Gérard, P. ; Francis, L.A. ; Flandre, D.

  • Author_Institution
    ICTEAM Inst., Univ. Catholique de Louvain, Louvain-La-Neuve, Belgium
  • fYear
    2010
  • fDate
    11-14 Oct. 2010
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    An ultra-low-power temperature-sensor-based silicon-on-insulator (SOI) CMOS Integrated Circuit (IC) for harsh environment application is presented. It first detects a temperature threshold, secondly generates a wake-up signal that turns on a data-acquisition microprocessor once the threshold has been detected and thirdly operates as a temperature sensor in a harsh environment while being wired to the microprocessor kept in a safe area. The IC is continuously on for a very long period of time and is required to be powered from a ultrathin battery type, hence must be an ultra low power design. It includes a diode-based temperature sensor, a quasi-temperature independent voltage generator, a comparator and a power switch to limit the microprocessor stand-by consumption. Since our application is mainly for harsh environment (e.g. high temperature, radiation), the chip has been designed using the 1-μm high-temperature SOI-CMOS XFAB technology; it occupies an area of 560μmxl65μm. The biasing current and power dissipation are 4.12 μA and 20.6 μW respectively at a supply voltage of 5V and temperature of 27°C, according to the post-layout transistor level simulation results.
  • Keywords
    CMOS integrated circuits; low-power electronics; microprocessor chips; silicon-on-insulator; temperature sensors; comparator; data acquisition microprocessor; diode-based temperature sensor; harsh environment SOI-CMOS design; high-temperature SOI-CMOS XFAB technology; power switch; quasitemperature independent voltage generator; silicon-on-insulator CMOS integrated circuit; temperature threshold; threshold detection; ultra low power SOI-CMOS design; ultrathin battery type; wake-up IC; CMOS integrated circuits; Generators; Low power electronics; Microprocessors; Temperature distribution; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOI Conference (SOI), 2010 IEEE International
  • Conference_Location
    San Diego, CA
  • ISSN
    1078-621x
  • Print_ISBN
    978-1-4244-9130-8
  • Electronic_ISBN
    1078-621x
  • Type

    conf

  • DOI
    10.1109/SOI.2010.5641369
  • Filename
    5641369