Title :
A probabilistic approach to optimal estimation part I: Problem formulation and methodology
Author :
Dabbene, Fabrizio ; Sznaier, M. ; Tempo, Roberto
Author_Institution :
IEIIT Inst., Politec. di Torino, Torino, Italy
Abstract :
The classical approach to system identification is based on statistical assumptions about the measurement error and provides estimates that have stochastic nature. Worst-case identification, on the other hand, only assumes the knowledge of deterministic error bounds and provides guaranteed estimates. The focal point of this paper is to provide a rapproachement between these two paradigms and propose a novel probabilistic framework for system identification. The main idea in this line of research is to “discard” sets of measure at most ϵ, where ϵ is a probabilistic accuracy, from the set of deterministic estimates. Therefore, we are decreasing the so-called worst-case radius of information at the expense of a given probabilistic “risk.” The main results of the paper establish rigorous theoretical properties of a trade-off curve, called optimal violation function, which shows how the radius of information decreases as a function of the accuracy. In the companion paper [8], we develop algorithms (randomized and deterministic) which exploit these theoretical results for efficiently computing the optimal violation function.
Keywords :
deterministic algorithms; estimation theory; identification; measurement errors; probability; randomised algorithms; deterministic algorithms; deterministic error bounds; deterministic estimates; focal point; guaranteed estimates; measurement error; optimal estimation; optimal violation function; probabilistic accuracy; probabilistic approach; probabilistic framework; randomized algorithms; so-called worst-case radius; statistical assumptions; stochastic nature; system identification; trade-off curve; worst-case identification; Accuracy; Approximation algorithms; Context; Noise; Probabilistic logic; Q measurement; Uncertainty; System identification; optimal algorithms; uncertain systems;
Conference_Titel :
Decision and Control (CDC), 2012 IEEE 51st Annual Conference on
Conference_Location :
Maui, HI
Print_ISBN :
978-1-4673-2065-8
Electronic_ISBN :
0743-1546
DOI :
10.1109/CDC.2012.6426541