Title :
Charge trapping levels in vacuum deposited poly (vinylidene fluoridechlorotrifluoroethylene) copolymer thin films
Author :
Chand, S. ; Sharma, G.D. ; Dwivedi, S.
Author_Institution :
Nat. Phys. Lab., New Delhi
Abstract :
Thermally stimulated discharge current (TSD) behaviour of vacuum deposited polyvinylidene fluoride-chlorotrifluoroethylene copolymer films (~ 10000 A) has been studied as a function of polarization field (1.0 x 103 - 2.0 x 104 V/cm). The TSD spectra of these films show a single relaxation peak whose charge and peak current vary non-linearly with the polarization field. The origin of the relaxation peak has been attributed to the migration of the charge carriers, injected from the electrodes, at the macroscopic distances and their subsequent trapping at energy levels lying ~ 0.48 eV.
Keywords :
electron traps; polymer blends; polymer films; thermally stimulated currents; thin films; vacuum deposited coatings; charge carrier migration; charge trapping levels; copolymer thin films; poly(vinylidene fluoride-chlorotrifluoroethylene); thermally stimulated discharge current; vacuum deposition; Current measurement; Dielectric materials; Electrodes; Electron traps; Material storage; Organic light emitting diodes; Polarization; Polymer films; Sputtering; Temperature; Charge trapping; activation energy; copolymer; relaxation peak;
Conference_Titel :
Physics of Semiconductor Devices, 2007. IWPSD 2007. International Workshop on
Conference_Location :
Mumbai
Print_ISBN :
978-1-4244-1728-5
Electronic_ISBN :
978-1-4244-1728-5
DOI :
10.1109/IWPSD.2007.4472591
