DocumentCode :
3174050
Title :
200 Mb wafer memory
Author :
MacDonald, N. ; Neish, G. ; Sinclair, A. ; Baba, F. ; Tatematsu, T. ; Hirawa, K. ; Miyasaka, K.
Author_Institution :
Anamartic Ltd., Cambridge, UK
fYear :
1989
fDate :
15-17 Feb. 1989
Firstpage :
240
Lastpage :
241
Abstract :
The realization of a high-capacity whole-wafer memory is described, including wafer configuration, chip architecture, process technology, and performance. The wafer is essentially a single-ported serial memory device. An innovative concept which utilizes any defective chips free from power failures has made possible a high-yield wafer-scale memory. The wafer includes an array of chips which have a DRAM (dynamic RAM) core and additional control logic known as the configuration logic (Conlog). Each Conlog is connected to its four neighbors by signal lines, which form logic networks on the wafer. An external controller transmits commands to each Conlog element to set up links between chips and configure a single contiguous data path known as a spiral. The spiral is configured on completion of wafer processing by external control software which implements chip test and linking of chips as a single-shaped data-flow chain. The DRAM core and Conlog are designed using a standard 1-Mb DRAM fabricated by the 1.3- mu m CMOS process. The waveform of the internal clock and output of the DRAM are shown as well as the output waveform of the receive terminal of Conlog.<>
Keywords :
CMOS integrated circuits; VLSI; integrated circuit technology; integrated memory circuits; random-access storage; 1.3 micron; 200 Mbit; CMOS process; Conlog; DRAM; additional control logic; array of chips; chip architecture; chip test; configuration logic; dynamic RAM; external control software; external controller; high-capacity whole-wafer memory; high-yield wafer-scale memory; internal clock waveform; logic networks; output waveform; performance; process technology; single contiguous data path; single-ported serial memory device; single-shaped data-flow chain; spiral; wafer configuration; CMOS process; Clocks; DRAM chips; Joining processes; Logic arrays; Logic devices; Process control; Random access memory; Software testing; Spirals;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 1989. Digest of Technical Papers. 36th ISSCC., 1989 IEEE International
Conference_Location :
New York, NY, USA
Type :
conf
DOI :
10.1109/ISSCC.1989.48272
Filename :
48272
Link To Document :
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