• DocumentCode
    3174290
  • Title

    High productivity thermocompression flip chip bonding

  • Author

    Clauberg, Horst ; Marte, Andreas ; Yanli Yang ; Eder, Jim ; Colosimo, Tom ; Buergi, Daniel ; Rezvani, Alireza ; Chylak, Bob

  • Author_Institution
    Kulicke & Soffa Industres, Inc., Fort Washington, PA, USA
  • fYear
    2015
  • fDate
    26-29 May 2015
  • Firstpage
    22
  • Lastpage
    29
  • Abstract
    Thermocompression (TC) bonding is seen as the next-generation packaging technology that will enable faster and more energy efficient devices in the face of slowing cost-performance gains achievable by advancing wafer fabrication technology. TC bonding will enable higher I/O counts and finer pitch interconnections than traditional interconnect methods through better control of the stress and warpage between devices and the substrate. In combination with through-silicon-vias (TSVs), TC bonding allows advanced memory stacks, such as the Hybrid Memory Cube and Wide-I/O memory.
  • Keywords
    flip-chip devices; integrated circuit interconnections; tape automated bonding; advanced memory stacks; advancing wafer fabrication technology; energy efficient devices; finer pitch interconnections; high productivity thermocompression flip chip bonding; hybrid memory cube; interconnect methods; next-generation packaging technology; through-silicon-vias; wide-I/O memory; Assembly; Bonding; Cooling; Films; Substrates; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
  • Conference_Location
    San Diego, CA
  • Type

    conf

  • DOI
    10.1109/ECTC.2015.7159566
  • Filename
    7159566