• DocumentCode
    3174648
  • Title

    Effect of binder chemistry on the electrical conductivity of air-cured epoxy-based electrically conductive adhesives containing copper filler

  • Author

    Inoue, Masahiro ; Notsuke, Takashi ; Sakaniwa, Yoshiaki ; Tada, Yasunori

  • Author_Institution
    Adv. Sci. Res. Leaders Dev. Unit, Gunma Univ., Kiryu, Japan
  • fYear
    2015
  • fDate
    26-29 May 2015
  • Firstpage
    146
  • Lastpage
    150
  • Abstract
    An epoxy-based electrically conductive adhesive containing Cu microrods as a filler was prepared using an amine-based hardener. This adhesive can exhibit a low electrical resistivity of 10-4 Ωcm after curing in air. The development of electrical conduction paths in the adhesive was dynamically analyzed by viscoelastic characterization combined with electrical resistance monitoring. Conduction paths developed through two elementary steps: microstructure formation of a filler network and evolution of the electrical conductivity between filler particles. In the Cu-loaded adhesive, a Cu-amine complex that formed in the paste during initial heating was suggested to be reduced in the same temperature range as where the conduction paths developed during curing. Therefore, control of the interfacial reaction between binder and fillers will be useful to help develop advanced Cu-loaded conductive adhesives.
  • Keywords
    conductive adhesives; copper; curing; electrical conductivity; filler metals; viscoelasticity; Cu; Cu-amine complex; Cu-loaded adhesive; advanced Cu-loaded conductive adhesives; amine-based hardener; binder; electrical conduction paths; electrical conductivity; electrical resistance monitoring; epoxy-based electrically conductive adhesive; filler network; filler particles; interfacial reaction; microrods; microstructure formation; viscoelastic characterization; Conductivity; Curing; Heating; Joints; Oscillators; Resistance; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
  • Conference_Location
    San Diego, CA
  • Type

    conf

  • DOI
    10.1109/ECTC.2015.7159584
  • Filename
    7159584