DocumentCode
3174730
Title
Technology of packaging by Liquid Mold-Underfill (MUF) material for advanced mobile devices
Author
Ishikawa, Yuki ; Yukimaru, Joji ; Takao, Tomoya ; Ikeda, Kazuhiro ; Yamane, Kazuaki ; Nakao, Akira ; Hisanaga, Naokatsu
Author_Institution
Semicond. Dept., Sanyu Rec Co., Ltd., Takatsuki, Japan
fYear
2015
fDate
26-29 May 2015
Firstpage
175
Lastpage
179
Abstract
As one approach of advanced packaging technologies, high reliability Liquid Mold UnderFill (Liquid MUF) materials and unique process will be presented here. Liquid MUF materials have the features of high adhesion, low CTE and low modulus. It is possible to alleviate the stress of the solder of each device mounted in the package, and they have excellent reliability too. These materials are adjusted the workability depending on the application. Moreover, because of low viscosity, the Liquid MUF material could be mold-underfilled with relatively lower stress to large Flip Chip devices with small gap and narrow pitch compared to the conventional solid materials. As for the processes of the liquid materials, printing, dispensing and compression molding are applicable. In this paper, the printing process, especially vacuum printing encapsulation systems (VPES) and pressure curing systems, will be mainly discussed. In addition, module package structure that achieved by these material and process development will be also explained in detail.
Keywords
adhesion; compression moulding; curing; electronics packaging; encapsulation; flip-chip devices; integrated circuit reliability; solders; viscosity; VPES; adhesion; advanced mobile devices; compression molding; flip chip devices; liquid MUF materials; module package structure; packaging technology; pressure curing systems; reliability liquid mold underfill materials; solder stress; vacuum printing encapsulation systems; viscosity; Curing; Encapsulation; Filling; Liquids; Ovens; Printing; Reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
Conference_Location
San Diego, CA
Type
conf
DOI
10.1109/ECTC.2015.7159588
Filename
7159588
Link To Document