• DocumentCode
    3174730
  • Title

    Technology of packaging by Liquid Mold-Underfill (MUF) material for advanced mobile devices

  • Author

    Ishikawa, Yuki ; Yukimaru, Joji ; Takao, Tomoya ; Ikeda, Kazuhiro ; Yamane, Kazuaki ; Nakao, Akira ; Hisanaga, Naokatsu

  • Author_Institution
    Semicond. Dept., Sanyu Rec Co., Ltd., Takatsuki, Japan
  • fYear
    2015
  • fDate
    26-29 May 2015
  • Firstpage
    175
  • Lastpage
    179
  • Abstract
    As one approach of advanced packaging technologies, high reliability Liquid Mold UnderFill (Liquid MUF) materials and unique process will be presented here. Liquid MUF materials have the features of high adhesion, low CTE and low modulus. It is possible to alleviate the stress of the solder of each device mounted in the package, and they have excellent reliability too. These materials are adjusted the workability depending on the application. Moreover, because of low viscosity, the Liquid MUF material could be mold-underfilled with relatively lower stress to large Flip Chip devices with small gap and narrow pitch compared to the conventional solid materials. As for the processes of the liquid materials, printing, dispensing and compression molding are applicable. In this paper, the printing process, especially vacuum printing encapsulation systems (VPES) and pressure curing systems, will be mainly discussed. In addition, module package structure that achieved by these material and process development will be also explained in detail.
  • Keywords
    adhesion; compression moulding; curing; electronics packaging; encapsulation; flip-chip devices; integrated circuit reliability; solders; viscosity; VPES; adhesion; advanced mobile devices; compression molding; flip chip devices; liquid MUF materials; module package structure; packaging technology; pressure curing systems; reliability liquid mold underfill materials; solder stress; vacuum printing encapsulation systems; viscosity; Curing; Encapsulation; Filling; Liquids; Ovens; Printing; Reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
  • Conference_Location
    San Diego, CA
  • Type

    conf

  • DOI
    10.1109/ECTC.2015.7159588
  • Filename
    7159588