DocumentCode
3174944
Title
A gate driver based soft-switching SiC bipolar junction transistor
Author
Yu, Huijie ; Lai, Jason ; Huang, Xudong ; Zhao, Jian H. ; Zhang, Jianhui ; Hu, Xiangyang ; Carter, John ; Fursin, Leonid
Author_Institution
Center for Power Electron. Syst., Virginia Tech, Blacksburg, VA, USA
Volume
2
fYear
2003
fDate
9-13 Feb. 2003
Firstpage
968
Abstract
This paper presented a new soft-switching concept that the soft transition is achieved based on gate driver control. A new soft-switched IGBT and MOSFET Gated Transistor (SS-IMGT) base drive structure is proposed for high power SiC BJT. The proposed base scheme can proportionally drive SiC BJT into near-saturate region. In addition, the zero voltage turn-on for BJT can be adaptively achieved at all load current range with very simple control. The whole SS-IGMT structure could be regarded as an "improved" voltage driven device. The new structure has inherent soft transition property with reduced stress and switching loss. The proposed gate driver based soft switching method is verified by experimental test with both Si and SiC BJT. SiC BJT demonstrate superior turn-off behavior compared to Si BJT. Further effort will be on utilizing the excess energy of resonant inductor to further reduce the conduction voltage drop across SiC BJT.
Keywords
MOSFET; driver circuits; insulated gate bipolar transistors; invertors; power bipolar transistors; silicon compounds; IGBT gated transistor; MOSFET gated transistor; SS-IGMT; SiC; ZVT; base drive; bipolar junction transistor; conduction voltage drop; gate driver control; inverter; power SiC BJT; resonant inductor; saturate region; soft-switching; switching loss; turn-off behavior; Driver circuits; Insulated gate bipolar transistors; MOSFET circuits; Power MOSFET; Resonance; Silicon carbide; Stress; Switching loss; Testing; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition, 2003. APEC '03. Eighteenth Annual IEEE
Conference_Location
Miami Beach, FL, USA
Print_ISBN
0-7803-7768-0
Type
conf
DOI
10.1109/APEC.2003.1179334
Filename
1179334
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