DocumentCode :
3175026
Title :
Effect of Catalyst Film Thickness on the Growth, Microstructure and Field Emission Characteristics of Carbon Nanotubes
Author :
Srivastava, Sanjay K. ; Vankar, V.D. ; Kumar, Vikram
Author_Institution :
Nat. Phys. Lab., New Delhi
fYear :
2007
fDate :
16-20 Dec. 2007
Firstpage :
836
Lastpage :
839
Abstract :
Aligned multiwalled carbon nanotubes (CNTs) were grown by microwave plasma enhanced chemical vapor deposition on Si substrates using C2H2 and NH3 gas mixture. Effect of Fe film thickness (5-30 nm) on the growth, microstructure and field emission characteristics of CNT films were investigated. Both Fe particle size and CNTs diameter increased with Fe thickness but CNTs length decreased. CNTs grown up to a Fe thickness of 20 nm, were found to have mainly well arranged bamboo-structures. However, for higher Fe thickness, CNTs were found to have mostly dual structural feature (solid fiberlike + bamboo- structure). It is suggested that relative rates of bulk and surface diffusions of carbon, which is catalyst size dependent, are responsible for such structural features. Field emission measurements of the CNT films showed turn-on field to be 1.6-3.2 V/ mum.
Keywords :
carbon; carbon nanotubes; catalysts; chemical vapour deposition; field emission; iron; metallic thin films; particle size; surface diffusion; C; CNT films; Fe; Si; aligned multiwalled carbon nanotubes; carbon nanotubes growth; catalyst film thickness effects; field emission characteristics; field emission measurements; gas mixture; microstructure characteristics; microwave plasma enhanced chemical vapor deposition; particle size; size 5 nm to 30 nm; surface diffusions; turn-on field characteristics; Carbon dioxide; Carbon nanotubes; Chemical vapor deposition; Iron; Mechanical factors; Microstructure; Plasma chemistry; Plasma materials processing; Plasma temperature; Substrates; CNTs; Diffusion; Field Emission; MPECVD;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Physics of Semiconductor Devices, 2007. IWPSD 2007. International Workshop on
Conference_Location :
Mumbai
Print_ISBN :
978-1-4244-1728-5
Electronic_ISBN :
978-1-4244-1728-5
Type :
conf
DOI :
10.1109/IWPSD.2007.4472650
Filename :
4472650
Link To Document :
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