DocumentCode :
3175387
Title :
Development of a consistent multiaxial viscoelastic model for package warpage simulation
Author :
Tz-Cheng Chiu ; Dong-Yi Huang ; Bo-Sheng Lee ; Dao-Long Chen ; Ping-Feng Yang ; Chin-Li Kao
Author_Institution :
Nat. Cheng Kung Univ., Tainan, Taiwan
fYear :
2015
fDate :
26-29 May 2015
Firstpage :
373
Lastpage :
379
Abstract :
A procedure for constructing the three-dimensional viscoelastic constitutive model of polymeric packaging material over a wide range of temperatures is presented. By using both tensile and torsional dynamic mechanical analyses (DMA) and thermal mechanical analyses (TMA), the viscoelastic constitutive behavior of a low-filler-percentage epoxy molding compound (EMC) was first characterized. Storage modulus mastercurves obtained from the DMA were converted to the relaxation moduli in the Laplace-Carson transform domain. The transformed Young´s and shear relaxation moduli were then curve fitted by using an optimization procedure with restriction for ensuring physically admissible time-dependent Poisson´s ratio. Bulk and shear relaxation moduli were then obtained from the fitted moduli and inverse transformed to the time domain. A numerical finite element model that considers the viscoelastic constitutive behavior of EMC was applied to simulate warpage of an overmolded flip-chip package under the surface mount solder reflow process and compared to experimental shadow Moiré measurements for validating the constitutive model.
Keywords :
Poisson equation; Young´s modulus; finite element analysis; flip-chip devices; inverse transforms; moulding; reflow soldering; shear strength; surface mount technology; tensile strength; time-domain analysis; viscoelasticity; EMC; Laplace-Carson transform domain; Poisson´s ratio; Young´s relaxation moduli; bulk relaxation moduli; consistent multiaxial viscoelastic model; epoxy molding compound; inverse transform; numerical finite element model; optimization procedure; overmolded flip-chip package; package warpage simulation; polymeric packaging material; shear relaxation moduli; storage modulus master curves; surface mount solder reflow process; tensile analysis; thermal mechanical analysis; three-dimensional viscoelastic constitutive model; time domain; torsional dynamic mechanical analysis; Electromagnetic compatibility; Mathematical model; Numerical models; Solid modeling; Temperature; Temperature measurement; Transforms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
Conference_Location :
San Diego, CA
Type :
conf
DOI :
10.1109/ECTC.2015.7159620
Filename :
7159620
Link To Document :
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