Title :
A fourth-order compact difference scheme for Maxwell´s equations
Author :
Young, J.L. ; Gaitonde, D. ; Shang, J.S.
Author_Institution :
Dept. of Electr. Eng., Idaho Univ., Moscow, ID, USA
Abstract :
A compact, central-difference approximation, in conjunction with the Yee grid, is used to compute the spatial derivatives in Maxwell´s equations. To advance the semi-discrete equations, the four-stage Runge-Kutta integrator is invoked. This combination of spatial and temporal differencing leads to a scheme that is fourth-order accurate, conditionally stable and highly efficient. Moreover, the use of compact differencing allows one to apply the compact operator in the vicinity of a perfect conductor-an attribute not found in other higher-order methods. Results are provided that quantify the spectral properties of the method. Simulations are conducted on problem spaces that span one and three dimensions and whose domains are of the open and closed type. Results from these simulations are compared with exact, closed-form solutions; the agreement between these results is consistent with numerical analysis.
Keywords :
Maxwell equations; Runge-Kutta methods; difference equations; integration; mathematical operators; rectangular waveguides; spectral analysis; waveguide theory; Maxwell´s equations; Yee grid; central-difference approximation; compact operator; conditionally stable method; efficient method; exact closed-form solutions; four-stage Runge-Kutta integrator; fourth-order compact difference scheme; numerical analysis; perfect conductor; problem spaces; rectangular waveguide; semi-discrete equations; simulations; spatial derivatives; spatial differencing; spectral properties; temporal differencing; Analytical models; Boundary conditions; Closed-form solution; Conductors; Frequency; Grid computing; Linear systems; Maxwell equations; Numerical analysis;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1997. IEEE., 1997 Digest
Conference_Location :
Montreal, Quebec, Canada
Print_ISBN :
0-7803-4178-3
DOI :
10.1109/APS.1997.631728