Title : 
Electromagnetic scattering from targets above rough surfaces
         
        
            Author : 
Chiu, T. ; Sarabandi, K.
         
        
            Author_Institution : 
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
         
        
        
        
        
        
            Abstract : 
In this paper, an analytical solution for predicting the near-field interaction between a scatterer and a rough surface is presented. This solution is derived using a novel technique based on the reciprocity theorem. This approach is extremely efficient, since only the current distribution of isolated scatterers are needed to evaluate the interaction in the far-field region. In specific, the second moments of the backscatter fields forming a circular dielectric cylinder above a slightly rough surface with inhomogeneous dielectric profile are derived. The accuracy of the theoretical formulation is verified by conducting polarimetric backscatter measurements from a lossy dielectric cylinder above a slightly rough surface. Excellent agreement between the theoretical prediction and experimental results is obtained.
         
        
            Keywords : 
backscatter; current distribution; electromagnetic wave scattering; radar cross-sections; radar cross-sections5822324; radar polarimetry; radar theory; wave equations; RCS; analytical solution; backscatter fields; circular dielectric cylinder; current distribution; electromagnetic scattering; far-field region; inhomogeneous dielectric profile; isolated scatterers; near-field interaction; polarimetric backscatter measurements; radar; reciprocity theorem; rough surfaces; second moments; targets; Backscatter; Dielectrics; Electromagnetic scattering; Optical scattering; Optical surface waves; Particle scattering; Radar scattering; Rough surfaces; Surface roughness; Vegetation mapping;
         
        
        
        
            Conference_Titel : 
Antennas and Propagation Society International Symposium, 1997. IEEE., 1997 Digest
         
        
            Conference_Location : 
Montreal, Quebec, Canada
         
        
            Print_ISBN : 
0-7803-4178-3
         
        
        
            DOI : 
10.1109/APS.1997.631762