DocumentCode :
3175811
Title :
Development of Chip-on-Wafer (CoW) stacked chip packaging for high-end CIS application
Author :
Ni, Tom ; Lien, Lisa ; Chen, Nuno ; Huang, K.Y. ; Chang, Winson ; Chung, K.W. ; Huang, Wesley ; Wang, Roger ; Chen, M.J. ; Liu, Alex ; Hsu, S.C. ; Lin, James ; Chang, C.C. ; Tai, Johnson
Author_Institution :
Powertech Technol. Inc., Hsinchu, Taiwan
fYear :
2015
fDate :
26-29 May 2015
Firstpage :
555
Lastpage :
559
Abstract :
CIS is one of the important components in the coming big thing IoT since it has been popularly adopted in many applications. Smart phone is the most popular application seeing anywhere. The CIS cameras in a smart phone are usually defined as primary camera and secondary camera. The function of primary camera is mainly used to take photo and secondary camera is used either to take photo or for visual communication. The common package solution for the primary camera is wire bonding package module, and the secondary camera is chip scale package (CSP). For the primary camera, when the pixel size is getting smaller and resolution is getting higher, it leads a possibility of die partition of image sensor and signal processor. In this research, PTI developed an alternative packaging solution for high-end primary camera. Wafer support system, low aspect ratio TSV, and CoW die stacking are the key process developments enabling this technology. The reliability test passed pre-condition level 3 and temperature cycling test 1000 cycles to prove a robust package solution.
Keywords :
CMOS image sensors; Internet of Things; chip scale packaging; digital signal processing chips; elemental semiconductors; integrated circuit reliability; integrated circuit testing; lead bonding; silicon; smart phones; thermal analysis; three-dimensional integrated circuits; visual communication; CIS application; CIS cameras; CMOS image sensor; CSP; CoW die stacking; Internet of Things; IoT; PTI; Si; TSV; chip scale package; chip-on-wafer; die partition; pixel size; primary camera; reliability test; secondary camera; signal processor; smart phone; stacked chip packaging; temperature cycling test; through silicon vias; visual communication; wafer support system; wire bonding package module; Bonding; Cameras; Encapsulation; Inspection; Reliability; Stacking;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
Conference_Location :
San Diego, CA
Type :
conf
DOI :
10.1109/ECTC.2015.7159645
Filename :
7159645
Link To Document :
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