Title :
High frequency MOS transistor matching measurements for the determination of mixer port crosstalk
Author_Institution :
Aalborg Univ., Denmark
Abstract :
The cancellation of port crosstalk in an integrated balanced mixer is limited by random transistor mismatch. A method for calculating this crosstalk at giga-hertz frequencies is presented. The crosstalk is calculated from the differences between measured transistor scattering parameters for a pair of identical devices. Measurement uncertainties are discussed. The method is applied to an active integrated CMOS mixer to find the RF-LO isolation
Keywords :
CMOS integrated circuits; MMIC mixers; MOSFET; S-parameters; crosstalk; field effect MMIC; interference suppression; measurement uncertainty; microwave field effect transistors; microwave measurement; semiconductor device measurement; RF-LO isolation; active integrated CMOS mixer; crosstalk; high frequency MOS transistor matching measurements; identical device pair; integrated balanced mixer; measured transistor scattering parameters; measurement uncertainties; mixer port crosstalk; port crosstalk cancellation; random transistor mismatch; CMOS process; Crosstalk; Frequency measurement; Integrated circuit measurements; Local oscillators; MOSFETs; RF signals; Radio frequency; Radiofrequency integrated circuits; Scattering parameters;
Conference_Titel :
Microelectronic Test Structures, 2001. ICMTS 2001. Proceedings of the 2001 International Conference on
Conference_Location :
Kobe
Print_ISBN :
0-7803-6511-9
DOI :
10.1109/ICMTS.2001.928629
