Title :
Reliability issues for design and test of complex integrated circuits [in avionic systems]
Author :
Harrison, Lee H. ; Saraceni, Peter J., Jr.
Author_Institution :
Galaxy Sci. Corp., Egg Harbor Towship, NJ, USA
Abstract :
One of the functions of the FAA Technical Center´s Digital Systems Validation program is to educate FAA certification engineers in new technologies. This paper introduces the topic, Complex Integrated Circuits, along with some of the certification risks associated with this technology. This work is a partial summary of a technical report prepared for the FAA Technical Center´s Airport and Aircraft Safety R&D Branch, Flight Safety Research Section. This paper seeks to highlight some of the problems associated with complex digital hardware used in digital flight control and avionic systems
Keywords :
aircraft computers; aircraft control; application specific integrated circuits; avionics; certification; circuit CAD; computer testing; fault diagnosis; fault tolerant computing; field programmable gate arrays; integrated circuit design; integrated circuit reliability; integrated circuit testing; logic partitioning; redundancy; reliability; ASIC; FPGA; IC design; IC test; VHDL; avionic systems; certification risks; complex digital hardware; complex integrated circuits; complexity issues; digital flight control systems; fault identification; fault tolerance; fly-by-wire; internal logic partitioning; microprocessors; redundancy; reliability issues; Aerospace electronics; Aerospace engineering; Aerospace safety; Air safety; Certification; Circuit testing; Digital systems; FAA; Integrated circuit reliability; Integrated circuit technology;
Conference_Titel :
Digital Avionics Systems Conference, 1995., 14th DASC
Conference_Location :
Cambridge, MA
Print_ISBN :
0-7803-3050-1
DOI :
10.1109/DASC.1995.482826
