• DocumentCode
    3176044
  • Title

    Analysis of the current distribution between paralleled capacitors in a chopper on printed circuit board

  • Author

    Teulings, W. ; Schanen, J.L. ; Roudet, J.

  • Author_Institution
    Lab. d´´Electrotechnique, ENSIEG, Grenoble, France
  • Volume
    2
  • fYear
    1997
  • fDate
    5-9 Oct 1997
  • Firstpage
    1066
  • Abstract
    The current distribution between an electrolytic filtering capacitor and a ceramic decoupling capacitor is analyzed. A simple electrical equivalent circuit is developed that includes models of both capacitors and a lumped element model of the interconnects. Interconnect modeling is performed with CAD tool InCa, an implementation of the partial element equivalent circuit (PEEC) method. First, PSPICE simulation of a complete converter model with interconnects and semiconductors is performed. Next, the results are used to validate the simple electrical equivalent circuit. It is found that the lower part of the switching noise spectrum is filtered by the electrolytic capacitor, but that from 300 kHz on, the decoupling capacitor is the principal filtering device. The developed method can be generalized to the study of multiple paralleled capacitors
  • Keywords
    SPICE; ceramic capacitors; choppers (circuits); circuit CAD; electrolytic capacitors; equivalent circuits; printed circuits; 300 kHz; CAD tool; InCa; PSPICE simulation; ceramic decoupling capacitor; chopper; converter model; current distribution; electrical equivalent circuit; electrolytic filtering capacitor; interconnect modeling; lumped element model; multiple paralleled capacitors; paralleled capacitors; partial element equivalent circuit method; printed circuit board; switching noise spectrum filtering; Capacitors; Ceramics; Circuit noise; Circuit simulation; Current distribution; Equivalent circuits; Filtering; Integrated circuit interconnections; SPICE; Semiconductor device noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 1997. Thirty-Second IAS Annual Meeting, IAS '97., Conference Record of the 1997 IEEE
  • Conference_Location
    New Orleans, LA
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-4067-1
  • Type

    conf

  • DOI
    10.1109/IAS.1997.628993
  • Filename
    628993