Title :
A novel approach to the estimation of confidence limits for BJT model sets using a bootstrap technique
Author :
Macsweeney, D. ; McCarthy, K.G. ; Floyd, L. ; Riordan, M. ; Sattler, L. ; Mathewson, A. ; Power, J.A. ; Kelly, S.C.
Author_Institution :
Nat. Microelectron. Res. Centre, Univ. Coll. Cork, Ireland
Abstract :
In this paper, a novel method for the estimation of confidence intervals of extracted parameter values is proposed. The technique is based on a bootstrap method which evaluates the error distributions which are associated with parameter extraction techniques. Using this technique, a confidence interval can then be estimated for extracted parameter values. Results are presented for DC, capacitance and high frequency measurements
Keywords :
bipolar transistors; bootstrap circuits; capacitance; error analysis; parameter estimation; semiconductor device measurement; semiconductor device models; BJT model sets; DC measurements; bootstrap method; bootstrap technique; capacitance measurements; confidence intervals; confidence limits estimation; error distributions; extracted parameter values; high frequency measurements; parameter extraction techniques; Capacitance; Data mining; Educational institutions; Electrical resistance measurement; Frequency measurement; Microelectronics; Noise measurement; Noise robustness; Parameter extraction; Power engineering and energy;
Conference_Titel :
Microelectronic Test Structures, 2001. ICMTS 2001. Proceedings of the 2001 International Conference on
Conference_Location :
Kobe
Print_ISBN :
0-7803-6511-9
DOI :
10.1109/ICMTS.2001.928636
