Length determination of DNA fragments in atomic force microscope images

Author

Spisz, T.S. ; Costa, N. D´ ; Seymour, C.K. ; Hoh, J.H. ; Reeves, R. ; Bankman, I.N.

Author_Institution

Appl. Phys. Lab., Johns Hopkins Univ., Laurel, MD, USA

Volume

3

fYear

1997

fDate

26-29 Oct 1997

Firstpage

154

Abstract

A processing algorithm was developed to detect and determine the lengths of DNA fragments in atomic force microscope images. The algorithm was designed to account for varying image conditions, fragment sizes, and background contamination, while minimizing the processing time to provide a high throughput. Although a large enough sample of images has not been tested yet to determine precisely the accuracy, we estimate the accuracy to be within 2 pixels based on analysis of an ideal simulated image and an actual image

Keywords

DNA; atomic force microscopy; biological techniques; biology computing; image processing; length measurement; molecular biophysics; DNA fragments; accuracy; atomic force microscope images; background contamination; biophysical research technique; fragment sizes; image conditions; length determination; pixels; processing algorithm; processing time; throughput; Atomic force microscopy; Bioinformatics; Couplings; DNA; Diseases; Electrokinetics; Genetics; Genomics; Optical microscopy; Physics;

fLanguage

English

Publisher

ieee

Conference_Titel

Image Processing, 1997. Proceedings., International Conference on

Conference_Location

Santa Barbara, CA

Print_ISBN

0-8186-8183-7

Type

conf

DOI

10.1109/ICIP.1997.632033

Filename

632033