• DocumentCode
    3176275
  • Title

    Ultra-thin chip-in-flex (CIF) technology using anisotropic conductive films (ACFs) for wearable electronics applications

  • Author

    Ji-Hye Kim ; Tae-Ik Lee ; Ji-won Shin ; Taek-Soo Kim ; Kyung-Wook Paik

  • Author_Institution
    Dept. of Mater. Sci. & Eng., KAIST, Daejeon, South Korea
  • fYear
    2015
  • fDate
    26-29 May 2015
  • Firstpage
    714
  • Lastpage
    718
  • Abstract
    For improving the flexibility and compact package size, chip-on-flex (COF)/chip-in-flex(CIF) assembly using Anisotropic Conductive Films (ACFs) as interconnection materials are investigated for flexible packaging technology of wearable electronics applications. The fatigue reliability of COF/CIF packages under dynamic bending environment was investigated. COF packages were successfully fabricated using ACFs with 40 um thin silicon chips and flexible substrates. By attaching the cover adhesive film with a polyimide film to COF packages, CIF packages were successfully fabricated as well. Through both convex and concave dynamic bending test, the thickness of cover adhesive film was optimized and then the minimum bending radius was obtained at no chip-crack condition. After fabrication of CIF packages with optimal cover adhesive film thickness of 30 um, and the effect of 3 types of ACFs on the dynamic bending performance of CIF packages up to 160 k cycles was also investigated. CIF packages using ACFs of higher modulus showed excellent fatigue reliability and stable ACF joints without delamination or resin crazing during dynamic bending test conditions.
  • Keywords
    bending strength; elemental semiconductors; flexible electronics; integrated circuit packaging; integrated circuit reliability; silicon; thin film circuits; ACF; CIF technology; COF/ CIF assembly; Si; anisotropic conductive films; bending test; chip-on-flex/chip-in-flex assembly; fatigue reliability; flexible packaging technology; interconnection materials; polyimide film; size 40 mum; ultrathin chip-in-flex technology; wearable electronics; Films; Plastics; Polyimides; Reliability; Resins; Resistance; Strain;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC) , 2015 IEEE 65th
  • Conference_Location
    San Diego, CA
  • Type

    conf

  • DOI
    10.1109/ECTC.2015.7159670
  • Filename
    7159670