DocumentCode :
31764
Title :
Design and Analysis of Silicon Photonics Wave Guides Using Symbolic Methods
Author :
Koranne, S.
Author_Institution :
, Mentor Graphics Corporation, Wilsonville, OR, USA
Volume :
34
Issue :
3
fYear :
2015
fDate :
Mar-15
Firstpage :
341
Lastpage :
353
Abstract :
Although the demise of Moore’s law has been predicted many times in the recent past, the emergence of silicon photonics has the potential to extend the lifetime of Moore’s law significantly. Using conventional CMOS processing for the generation, routing, and processing of light waves, silicon photonics has finally brought the full power of photonics to very large scale integration (VLSI). However, along with these benefits, significant challenges in computer aided design of silicon photonics have also arisen. This paper presents a novel symbolic method based on Gröbner basis of tangent space polynomials of parametric curves to address these challenges. We analyze the design, optimization and verification of silicon photonic wave guides using parametric polynomials, and demonstrate the powerful method of Gröbner basis functions to solve complex problems such as envelope generation, rectification, manufacturability, singularity detection, reticle and etch processing model generation, tapering loss minimization, and bend loss minimization. We present the use of computer algebra systems such as MAXIMA and REDUCE, to analyze waveguide arrays. In addition, the methods presented in this paper can also be used for the analysis of curves arising from micro-electronic mechanical systems and micro-fluidics VLSI layouts.
Keywords :
Layout; Optical losses; Optical waveguides; Optimization; Silicon photonics; Very large scale integration; Algebraic geometry; Optoelectronic devices; algebraic geometry and layout verification; array waveguides; layout verification; optoelectronic devices; silicon photonics; symbolic methods;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2015.2394398
Filename :
7017570
Link To Document :
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