Title :
Resistor matching characterization for process development using D/A converter
Author :
Katakam, Shylaja ; Tranchina, Benjamin ; Bordelon, Jim ; Ramaswamy, Ananth ; Choi, Wooyoung ; Chu, Sanford
Author_Institution :
TestChip Technol. Inc., Dallas, TX, USA
Abstract :
In-depth process evaluation and robust device models are essential for integrating analog circuits into logic processes. This work presents a technique for resistor mismatch characterization using a D/A converter test circuit. This design offers a fast, wafer-level test of large resistor arrays representative of converter applications, allowing the designer to evaluate the impact of array area, resistor size, and resistor design on resolution limits. The test methodology is tailored for a production test environment
Keywords :
arrays; digital-analogue conversion; impedance matching; integrated circuit design; integrated circuit modelling; integrated circuit testing; mixed analogue-digital integrated circuits; production testing; resistors; D/A converter; D/A converter test circuit; analog circuit integration; array area; converter applications; logic processes; process development; process evaluation; production test environment; resistor arrays; resistor design; resistor matching characterization; resistor mismatch characterization; resistor size; resolution limits; robust device models; test methodology; wafer-level test; Analog circuits; Circuit testing; Decoding; Feeds; Logic devices; Pattern matching; Production; Resistors; Robustness; Semiconductor device testing;
Conference_Titel :
Microelectronic Test Structures, 2001. ICMTS 2001. Proceedings of the 2001 International Conference on
Conference_Location :
Kobe
Print_ISBN :
0-7803-6511-9
DOI :
10.1109/ICMTS.2001.928665
