Author index

fYear

2001

fDate

22-22 March 2001

Firstpage

269

Lastpage

271

Abstract

The author index contains an entry for each author and coauthor included in the proceedings record.

fLanguage

English

Publisher

ieee

Conference_Titel

Microelectronic Test Structures, 2001. ICMTS 2001. Proceedings of the 2001 International Conference on

Conference_Location

Kobe, Japan

Print_ISBN

0-7803-6511-9

Type

conf

DOI

10.1109/ICMTS.2001.928674

Filename

928674

Link To Document