DocumentCode :
3176763
Title :
Author index
fYear :
2001
fDate :
22-22 March 2001
Firstpage :
269
Lastpage :
271
Abstract :
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronic Test Structures, 2001. ICMTS 2001. Proceedings of the 2001 International Conference on
Conference_Location :
Kobe, Japan
Print_ISBN :
0-7803-6511-9
Type :
conf
DOI :
10.1109/ICMTS.2001.928674
Filename :
928674
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3176763