DocumentCode :
3177021
Title :
Conference Information
fYear :
2007
fDate :
9-13 July 2007
Keywords :
Atomic force microscopy; CD-ROMs; Conference proceedings; Control system synthesis; Credit cards; Elevators; Hydrogen; Reduced order systems; Robust control; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
American Control Conference, 2007. ACC '07
Conference_Location :
New York, NY
ISSN :
0743-1619
Print_ISBN :
1-4244-0988-8
Electronic_ISBN :
0743-1619
Type :
conf
DOI :
10.1109/ACC.2007.4283177
Filename :
4283177
Link To Document :
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