DocumentCode
3177021
Title
Conference Information
fYear
2007
fDate
9-13 July 2007
Keywords
Atomic force microscopy; CD-ROMs; Conference proceedings; Control system synthesis; Credit cards; Elevators; Hydrogen; Reduced order systems; Robust control; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference, 2007. ACC '07
Conference_Location
New York, NY
ISSN
0743-1619
Print_ISBN
1-4244-0988-8
Electronic_ISBN
0743-1619
Type
conf
DOI
10.1109/ACC.2007.4283177
Filename
4283177
Link To Document