DocumentCode
3177064
Title
Testing of the thermal-stress-cracking characteristics of silver-refractory contacts
Author
Wingert, Philip C.
Author_Institution
Adv. Metall. Inc., Export, PA, USA
fYear
1995
fDate
2-4 Oct. 1995
Firstpage
338
Lastpage
345
Abstract
Thermal stress cracking is an important mode of contact material degradation, especially in composite silver-refractory contact materials for circuit breaker applications. The formation of cracks can affect thermal conduction, arc motion, and the restrike potential even without causing excessive weight loss. The very transient thermal and material conditions during arc interruption make effective mathematical analysis difficult. A test system which allows a regulated supply voltage to be applied to a test device which then interrupts the current in a reproducible manner is described. This test allows the cracking behavior of contact materials to be empirically evaluated and compared. The cracks which formed during the interruption of elevated currents generally had one of two orientations, perpendicular or parallel to the face of the contact. When these two types of cracks intersect, large sections of a contact´s structure can be separated and lost. Surface structures which could initiate crack formation are described. The effects of cracks on heat flow through the contact are discussed. It is shown that cracks, after forming and propagating, can be infiltrated to a significant extent with silver.
Keywords
circuit-breaking arcs; electrical contacts; refractories; silver; switchgear testing; thermal stress cracking; Ag; arc interruption; arc motion; circuit breaker; composite silver-refractory contacts; heat flow; restrike potential; surface structures; testing; thermal conduction; thermal stress cracking; Circuit breakers; Circuit testing; Composite materials; Conducting materials; Mathematical analysis; System testing; Thermal conductivity; Thermal degradation; Thermal stresses; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Contacts, 1995., Proceedings of the Forty-First IEEE Holm Conference on
Conference_Location
Montreal, Quebec, Canada
Print_ISBN
0-7803-2728-4
Type
conf
DOI
10.1109/HOLM.1995.482889
Filename
482889
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