[Title page]

fYear

2011

fDate

14-16 March 2011

Abstract

The following topics are dealt with: device aging; analog integrated circuit; 3D integrated circuit; low power circuit; low power sensor; low power memories; lithography; digital design automation; noise-aware design; custom circuit design issue; FPGA; circuit verification; circuit validation; circuit test; circuit reliability; package and processor co-design; power integrity; system design consideration; error-resilient design; network routing; signal integrity; timing closure; power delivery; power estimation; CMOS design method; and analog design automation.

Keywords

CMOS integrated circuits; analogue integrated circuits; circuit reliability; circuit testing; electronic design automation; field programmable gate arrays; lithography; low-power electronics; memory architecture; network routing; network synthesis; sensors; 3D integrated circuit; CMOS design method; FPGA; analog design automation; analog integrated circuit; circuit reliability; circuit test; circuit validation; circuit verification; custom circuit design issue; device aging; digital design automation; error-resilient design; lithography; low power circuit; low power memories; low power sensor; network routing; noise-aware design; power delivery; power estimation; power integrity; signal integrity;

fLanguage

English

Publisher

ieee

Conference_Titel

Quality Electronic Design (ISQED), 2011 12th International Symposium on

Conference_Location

Santa Clara, CA

ISSN

1948-3287

Print_ISBN

978-1-61284-913-3

Type

conf

DOI

10.1109/ISQED.2011.5770686

Filename

5770686