DocumentCode :
3177109
Title :
Discovering structural regularity in facade image
Author :
Li, Weiwei ; Zheng, Xin ; Chen, Jie
Author_Institution :
Image Process. & Pattern Recognition Lab., Beijing Normal Univ., Beijing, China
fYear :
2010
fDate :
10-13 Oct. 2010
Firstpage :
2208
Lastpage :
2212
Abstract :
3D reconstruction from single view is a very difficult problem in computer vision and computer graphics. Few works have been done in this area. In this paper, we proposed a method to discover structural regularity in single facade images on the procedural modeling of buildings by using SIFT algorithm. Firstly, symmetry information is detected from the image using SIFT algorithm for image analysis. Next, the symmetry information will be removed from the facade image. Finally, get the SIFT feature of widows and doors. Experiments show that our method can successfully discover regular structures with a higher recognition rate than existing method especially amidst shadowing and the changing illumination environment.
Keywords :
computer graphics; computer vision; image recognition; image reconstruction; transforms; 3D reconstruction; SIFT algorithm; computer graphics; computer vision; facade image; procedural modeling; recognition rate; structural regularity; symmetry information detection; Laboratories; 3D reconstruction; Facade Detection; SIFT; procedural modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Systems Man and Cybernetics (SMC), 2010 IEEE International Conference on
Conference_Location :
Istanbul
ISSN :
1062-922X
Print_ISBN :
978-1-4244-6586-6
Type :
conf
DOI :
10.1109/ICSMC.2010.5641686
Filename :
5641686
Link To Document :
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