Algorithm-based fault detection of analog linear time-invariant circuits

Author

Guo, Zhen ; Savir, Jacob

Author_Institution

Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ, USA

Volume

1

fYear

2001

fDate

21-23 May 2001

Firstpage

49

Abstract

Three methods are introduced in this paper for detecting parametric faults in linear time-invariant circuits. All methods use the aggregation of the digitized output values as the circuit good-machine signature. Tolerance values that discriminate between the good and the bad circuit are being investigated. Experiments conducted on a small circuit are used to test the viability of the test methodology

Keywords

analogue integrated circuits; circuit analysis computing; fault diagnosis; fault tolerance; integrated circuit testing; state-space methods; transfer functions; algorithm-based fault detection; analog linear time-invariant circuits; circuit good-machine signature; difference-based approach; digitized output values aggregation; mixed signal test; observer-based approach; parametric faults; state space method; test methodology viability; tolerance values; transfer function; Analog circuits; Built-in self-test; Circuit faults; Circuit testing; Design for testability; Electrical fault detection; Electronic equipment testing; Fault detection; State-space methods; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE

Conference_Location

Budapest

ISSN

1091-5281

Print_ISBN

0-7803-6646-8

Type

conf

DOI

10.1109/IMTC.2001.928786

Filename

928786