Title :
Algorithm-based fault detection of analog linear time-invariant circuits
Author :
Guo, Zhen ; Savir, Jacob
Author_Institution :
Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ, USA
Abstract :
Three methods are introduced in this paper for detecting parametric faults in linear time-invariant circuits. All methods use the aggregation of the digitized output values as the circuit good-machine signature. Tolerance values that discriminate between the good and the bad circuit are being investigated. Experiments conducted on a small circuit are used to test the viability of the test methodology
Keywords :
analogue integrated circuits; circuit analysis computing; fault diagnosis; fault tolerance; integrated circuit testing; state-space methods; transfer functions; algorithm-based fault detection; analog linear time-invariant circuits; circuit good-machine signature; difference-based approach; digitized output values aggregation; mixed signal test; observer-based approach; parametric faults; state space method; test methodology viability; tolerance values; transfer function; Analog circuits; Built-in self-test; Circuit faults; Circuit testing; Design for testability; Electrical fault detection; Electronic equipment testing; Fault detection; State-space methods; System testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
Conference_Location :
Budapest
Print_ISBN :
0-7803-6646-8
DOI :
10.1109/IMTC.2001.928786
