Fault diagnosis in electronic circuits based on bilinear transformation in 3D and 4D space

Author

Czaja, Z. ; Zielonko, R.

Author_Institution

Fac. of Electron., Telecommun. & Inf., Tech. Univ. Gdansk, Poland

Volume

1

fYear

2001

fDate

21-23 May 2001

Firstpage

55

Abstract

In the paper a new method of localisation and identification of faulty components in linear electronic circuits based on bilinear transformation in 3D and 4D space is presented, as well as illustrating examples. The method can be applied in an input-output diagnosis of electronic circuits with the aid of different technologies: conventional measurement systems, testing buses and neural networks. It is also useful for parameter identification of other objects modelled by electrical circuits (electrochemical, biomedical, and electromechanical objects). The method can be utilised in practice for localisation and identification of single as well as double soft faults

Keywords

analogue integrated circuits; circuit analysis computing; fault diagnosis; integrated circuit testing; state-space methods; transfer functions; 3D space; 4D space; bilinear transformation; double soft faults; fault diagnosis; fault identification; fault localisation; input-output diagnosis; linear electronic circuits; neural networks; parameter identification; single soft faults; testing buses; Biomedical measurements; Circuit faults; Circuit testing; Electronic circuits; Electronic equipment testing; Fault diagnosis; Neural networks; Parameter estimation; Space technology; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE

Conference_Location

Budapest

ISSN

1091-5281

Print_ISBN

0-7803-6646-8

Type

conf

DOI

10.1109/IMTC.2001.928787

Filename

928787