DocumentCode :
3177239
Title :
Impact wear of multiplated connectors in the presence of electrical current
Author :
Yang, Qian ; Zhao, Zheming ; Engel, Peter A. ; Constable, James H.
fYear :
1995
fDate :
2-4 Oct. 1995
Firstpage :
135
Abstract :
The approach, represented by this work, makes a quantitative study of volume removal as well as of the impact wear mechanism in electrical connectors, taking place under a moderate electrical current. Comparison is made between pure mechanical wear and wear measured under electrical current. Wear mechanisms in the presence of electrical current are described. The testing apparatus utilized had the capability of exerting impacts at 2 to 50 Hz repetition rate, and at 0.5 to 3 m/s normal approach speed; the equivalent mass of the hammer was between 0.25 and 0.75 g. Experimental study was performed under two electrical configurations: a) constant voltage supply with 3 current limited resistor, and b) constant current supply. In the latter approach, currents up to 1 A were employed; the current was applied only after the contact was made, and removed before the contact was broken. A trace of the voltage drop was simultaneously displayed along with the impact force during the experimental runs. The additional effect of current, superposed on mechanical impact, was manifested mainly as temperature rise. Some arcing observations were also made. An analytical temperature evaluation method was devised, and was employed to show trends of a "steady state" temperature depending on impact duration, repetition rate and diffusion rate.
Keywords :
Connectors; Contacts; Current supplies; Plastic films; Stress; Surface cracks; Temperature dependence; Testing; Voltage; Electrical contact; impact wear; multiplated materials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 1995., Proceedings of the Forty-First IEEE Holm Conference on
Conference_Location :
Montreal, Quebec, Canada
Print_ISBN :
0-7803-2728-4
Type :
conf
DOI :
10.1109/HOLM.1995.482898
Filename :
482898
Link To Document :
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