DocumentCode :
3177347
Title :
3DICE: 3D IC cost evaluation based on fast tier number estimation
Author :
Chan, Cheng-Chi ; Yu, Yen-Ting ; Jiang, Iris Hui-Ru
Author_Institution :
Dept. of Electron. Eng. & Inst. of Electron., Nat. Chiao Tung Univ., Hsinchu, Taiwan
fYear :
2011
fDate :
14-16 March 2011
Firstpage :
1
Lastpage :
6
Abstract :
During the billion transistor era, 3D stacking offers an attractive solution for the difficulties resulting from large-scale design complexities. Moreover, 3D stacking can benefit performance, power, bandwidth, footprint, and heterogeneous technology mixing. However, before adopting the 3D design strategy, this study seeks to understand how much cost is required to trade these benefits. This paper proposes a 3D IC cost evaluation framework based on fast tier number estimation. Using a reformulated Rent´s rule, this study efficiently determines the number k of tiers to minimize the through-silicon via count and then automatically partitions a gate-level netlist into k tiers to minimize the total cost. This study conducted experiments on eight industrial test cases to show cost efficiency and effectiveness. Moreover, results prove that the reformulated Rent´s rule indicates a strong correlation between the tier number and through-silicon via usage.
Keywords :
costing; integrated circuit design; three-dimensional integrated circuits; 3D IC cost evaluation; 3D design strategy; 3D stacking; 3DICE; Rent rule; fast tier number estimation; through silicon via count; Bonding; Equations; Estimation; Mathematical model; Three dimensional displays; Through-silicon vias; 3D IC; TSV; cost evaluation; partitioning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2011 12th International Symposium on
Conference_Location :
Santa Clara, CA
ISSN :
1948-3287
Print_ISBN :
978-1-61284-913-3
Type :
conf
DOI :
10.1109/ISQED.2011.5770702
Filename :
5770702
Link To Document :
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